Fast image scanning method in liquid-AFM without image distortion.

MEMS-based fast scanning probe microscopes.

Scanning probe microscopy is a frequently used nanometer-scale surface investigation technique. Unfortunately, its applicability is limited by the relatively low image acquisition speed, typically seconds to minutes per image. Higher imaging speeds are desirable for rapid inspection of samples and for the study of a range of dynamic surface processes, such as catalysis and crystal growth. We ha...

Improving the scanning speed of atomic force microscopy at the scanning range of several tens of micrometers.

The atomic force microscope (AFM) is a powerful instrument which can measure the surface of samples at the nanoscale. The resonance of the scanner in xy directions, and the feedback control in the z direction are two major sources of image distortion at high scan speed. In order to improve the scanning speed of the AFM, a low-cost and easy method, which includes sinusoidal scans in the fast sca...

A Novel Method for Measuring, Regardless of Image Distortion and Lens Varying Specifications in Endoscopic Treatment of Vesicoureteral Reflux

Automated image segmentation-assisted flattening of atomic force microscopy images

Atomic force microscopy (AFM) images normally exhibit various artifacts. As a result, image flattening is required prior to image analysis. To obtain optimized flattening results, foreground features are generally manually excluded using rectangular masks in image flattening, which is time consuming and inaccurate. In this study, a two-step scheme was proposed to achieve optimized image flatten...

Effect of Phase-Encoding Reduction on Geometric Distortion and BOLD Signal Changes in fMRI

Introduction Echo-planar imaging (EPI) is a group of fast data acquisition methods commonly used in fMRI studies. It acquires multiple image lines in k-space after a single excitation, which leads to a very short scan time. A well-known problem with EPI is that it is more sensitive to distortions due to the used encoding scheme. Source of distortion is inhomogeneity in the static B0 field that ...